Skip to main content

Veeco Dimension 3100 AFM

An atomic force microscope uses a sharp tip to scan a small area on the surface of a sample. This provides an image of the surface features of the sample. With the Dimension 3100 AFM there is no limitation on the size of the sample; however, the maximum scan size is 100 microns x 100 microns and the maximum height is 5 microns.

Operational Modes

  • Contact mode
  • Tapping mode
  • Lateral force microscopy

Contact

Ryan Hilger
BRWN 4135B
560 Oval Drive
West Lafayette, IN 47907
(765) 494-5234
Email: rhilger1@purdue.edu

Veeco DimAFM