Skip Navigation

Asylum Cypher ES AFM

An atomic force microscope uses a sharp tip to scan a small area on the surface of a sample. This provides an image of the surface features of the sample. The sample can be no larger than 15 mm in diameter. The maximum scan size is 10 microns x 10 microns and the maximum height is 2.5 microns.

 

Operational Modes

  • Contact Mode
  • Tapping Mode
  • Fluid imaging
  • Conducting AFM
  • AMFM
  • Lateral Force Microscopy

Contact
Patricia Bishop
BRWN 3154A
560 Oval Drive
West Lafayette, IN 47907
(765) 494-7188
Email: pbishop@purdue.edu

Asylum Cypher ES AFM

Purdue University, West Lafayette, IN 47907 (765) 494-4600

Department of Chemistry, 560 Oval Drive, West Lafayette, Indiana 47907-2084 | Telephone: (765) 494-5200 | Fax: (765) 494-0239

© 2015 Purdue University | An equal access/equal opportunity university | Copyright Complaints | Maintained by Science IT

If you have trouble accessing this page because of a disability, please contact ScienceIT at sciencehelp@purdue.edu.