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Veeco Dimension 3100 AFM

An atomic force microscope uses a sharp tip to scan a small area on the surface of a sample. This provides an image of the surface features of the sample. With the Dimension 3100 AFM there is no limitation on the size of the sample; however, the maximum scan size is 100 microns x 100 microns and the maximum height is 5 microns.

 

Operational Modes

  • Contact mode
  • Tapping mode
  • Lateral force microscopy

Contact
Patricia Bishop
BRWN 3154A
560 Oval Drive
West Lafayette, IN 47907
(765) 494-7188
Email:pbishop@purdue.edu

Veeco DimAFM

Purdue University, West Lafayette, IN 47907 (765) 494-4600

Department of Chemistry, 560 Oval Drive, West Lafayette, Indiana 47907-2084 | Telephone: (765) 494-5200 | Fax: (765) 494-0239

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