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Veeco MultiMode AFM with Nanoscope V Controller

An atomic force microscope uses a sharp tip to scan a small area on the surface of a sample. This provides an image of the surface features of the sample. With the MultiMode AFM the sample can be no larger than 15 mm in diameter. The maximum scan size is 10 microns x 10 microns and the maximum height is 2.5 microns.

 

Operational Modes

  • Contact Mode
  • Tapping Mode
  • Lateral Force Microscopy
  • Scanning Tunneling Microscopy

Contact
Patricia Bishop
BRWN 3154A
560 Oval Drive
West Lafayette, IN 47907
(765) 494-7188
Email: pbishop@purdue.edu

Veeco Multimode AFM

Purdue University, West Lafayette, IN 47907 (765) 494-4600

Department of Chemistry, 560 Oval Drive, West Lafayette, Indiana 47907-2084 | Telephone: (765) 494-5200 | Fax: (765) 494-0239

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