Veeco MultiMode AFM with Nanoscope V Controller
An atomic force microscope uses a sharp tip to scan a small area on the surface of a sample. This provides an image of the surface features of the sample. With the MultiMode AFM the sample can be no larger than 15 mm in diameter. The maximum scan size is 10 microns x 10 microns and the maximum height is 2.5 microns.
- Contact Mode
- Tapping Mode
- Lateral Force Microscopy
- Scanning Tunneling Microscopy
560 Oval Drive
West Lafayette, IN 47907