X-Ray Fluorescence
The Epsilon 4, installed in August 2019, is a multi-functional benchtop Energy dispersive X-ray fluorescence (XRF) analyzer for elemental analysis from fluorine (F) to americium (Am) for bulk and trace analysis of inorganic and organic-inorganic hybrid materials, minerals, building materials as well as trace element analysis in oils and fuels, polymers, plastics, food, pharmaceuticals cosmetics and the environment.
It handles a wide variety of sample types, including solids, pressed and loose powders, liquids and filters and performs non-destructive quantitative analysis in concentrations from 100% down to sub-ppm levels (for heavier elements), on samples weighing anything from a few milligrams to kilograms. Elemental screening and element ratios are available using the Omnian standardless analysis solution.
The Ag anode X-ray tube guarantees best performance of P, S and Cl analysis. The spectrometer features a 10-position removable sample changer and can accommodate samples up to 52 mm (2 inch) in diameter.
Independent Use of the Epsilon 4 X-ray Fluorescence Spectrometer
The instrument is available for independent use, under the guidance of the crystallographer, for both Purdue researchers and visiting collaborators. Please contact the crystallographer if you would like to be trained on the use of the instrument and being granted off-hour access to the facility.
Users will have to pass Purdue’s Office of Radiological and Environmental Management’s (REM) Training quiz on X-ray Fluorescence (scroll down to "X-ray Fluorescence"), following the guidelines set by the State of Indiana. You do NOT have to fill out the A-4 form for our lab.
Basic supplies (films/foils, sample cups) will be provided at no charge. Films/foils are single use. Provided cups are reusable (please clean samples cups after use so that they will be available for the next user). For trace analysis and liquid samples we recommend to bring your own sample cups and use a new cup for each measurement.
Scheduling Instrument Time
Trained users can schedule instrument time on the Epsilon 4 XRF spectometer via Purdue's iLab web interface. Click the "Schedule Equipment" tab and then click the "View Schedule" button to access the calendar and schedule measurement times.
2023 XRF Instrument Usage Rates:
Users | Rates |
---|---|
Purdue campus users (self run) | $11 / hr |
Non-Purdue academic users (self run) | $17 / hr |
Commercial customers / For profit (self run) | $35 / hr off-hours 1) |
$70 / hr peak hours 1) | |
Purdue campus users (staff run) 2) | $66 / hr |
Non-Purdue academic users (staff run) 2) | $104 / hr |
Commercial customers / For profit (staff run) 2) | $200 / hr |
Data analysis assistance / consulting (Purdue) | $65 / hr |
Data analysis assistance / consulting (External) | $102 / hr |
1) Peak hours: Mon-Fri, 9 am - 5 pm
2) Please contact the crystallographer at zeller4@purdue.edu for analysis requests
Useful Links / Downloads
- SOP - Basic Standardless Data Collection ("Omnian", Purdue "walk through" manual)
- Epsilon 3 Quick Start Guide (Panalytical Document, 191 pages)
- Epsilon 4 User's Guide (Panalytical Document, 58 pages)
- Epsilon 4 Typical Data Collection with Standards (Panalytical Document, 1 poster)
- Epsilon 4 Typical Standardless Data Collection ("Omnian", Panalytical Document, 1 poster)
- Theory of XRF (Panalytical pamphlet)
- XRF Consumables Catalogue 2016 (Panalytical)
- Typical general procedure writeup for publications when using the Purdue University Panalytical Epsilon4 X-ray Fluorescence Spectrometer (Omnian Procedure)
Contact info
Dr. Matthias Zeller
Purdue University, Department of Chemistry
X-ray Crystallography, Wetherill 101B
560 Oval Drive
West Lafayette, Indiana 47907-2084
765-494-4572
zeller4@purdue.edu
- X-Ray Crystallography
- Staff
- Software
- Equipment
- Recent Publications
- How to Submit Samples, Scheduling and Lab Info
- Resources for Data Collection, Data Workup and Publication Writing
- Sample Submission, Single Crystal X-ray Diffraction
- Sample Submission, Powder and Multicrystalline XRD
- Sample submission, X-Ray Fluorescence
- X-ray Crystallography 12650 - CHM 69600