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Asylum Cypher ES AFM

An atomic force microscope uses a sharp tip to scan a small area on the surface of a sample. This provides an image of the surface features of the sample. The sample can be no larger than 15 mm in diameter. The maximum scan size is 10 microns x 10 microns and the maximum height is 2.5 microns.

Operational Modes

  • Contact Mode
  • Tapping Mode
  • Fluid imaging
  • Conducting AFM
  • AMFM
  • Lateral Force Microscopy

Contact

Ryan Hilger
BRWN 4135B
560 Oval Drive
West Lafayette, IN 47907
(765) 494-5234
Email: rhilger1@purdue.edu

Asylum Cypher ES AFM