Asylum Cypher ES AFM
Download user guide here (PDF)
Download force curves guide (PDF)
Download contact mode guide (PDF)
Download conductive mode guide (PDF)
An atomic force microscope uses a sharp tip to scan a small area on the surface of a sample. This provides an image of the surface features of the sample. The sample can be no larger than 15 mm in diameter. The maximum scan size is 10 microns x 10 microns and the maximum height is 2.5 microns.
Operational Modes
- Contact Mode
- Tapping Mode
- Fluid imaging
- Conducting AFM
- AMFM
- Lateral Force Microscopy
Contact
Aloke Bera
BRWN 3154
560 Oval Drive
West Lafayette, IN 47907
(765) 496-2216
Email: bera@purdue.edu
PDFs on this page are part of the Department of Chemistry's Web Archive. They are no longer maintained and may not meet web accessibility standards. To request them in an accessible format, contact Ryan Hilger at rhilger1@purdue.edu.