Asylum Cypher ES AFM
Download conductive mode guide
An atomic force microscope uses a sharp tip to scan a small area on the surface of a sample. This provides an image of the surface features of the sample. The sample can be no larger than 15 mm in diameter. The maximum scan size is 10 microns x 10 microns and the maximum height is 2.5 microns.
Operational Modes
- Contact Mode
- Tapping Mode
- Fluid imaging
- Conducting AFM
- AMFM
- Lateral Force Microscopy
Contact
Aloke Bera
BRWN 3154
560 Oval Drive
West Lafayette, IN 47907
(765) 496-2216
Email: bera@purdue.edu