Veeco MultiMode AFM with Nanoscope 6 Controller
Download the user guide here (PDF)
Download STM guide here (PDF)
The Veeco multi-mode atomic force microscope is used for nanoscale imaging, as well as electrical and mechanical characterization of surfaces and materials. Please see below for a list of capabilities and operational modes. The multi-mode is our highest resolution AFM; however, samples must be small (under 15 mm in diameter), and only small areas can be scanned (10 x 10 μm) compared to the Dimension AFM.
Operational Modes
- Contact Mode
- Tapping Mode
- ScanAsyst
- Peakforce Tapping
- Peakforce HR
- Peakforce Quantitative Nanomechanics (QNM)
- Phase Imaging
- Force Modulation
- Force Volume
- Lateral Force Microscopy (LFM)
- Electric Force Microscopy (EFM)
- Magnetic Force Microscopy (MFM)
- Kelvin Probe Force Microscopy (KPFM)
- Piezoresponse Force Microscopy
- Scanning Tunneling Microscopy (STM)
- Imaging in fluid
Specifications
- Sub-nanometer resolution
- Max scan size: 10 x 10 μm
- Max height: 2.5 μm
Contact
Aloke Bera
BRWN 3154
560 Oval Drive
West Lafayette, IN 47907
(765) 496-2216
Email: bera@purdue.edu
PDFs on this page are part of the Department of Chemistry's Web Archive. They are no longer maintained and may not meet web accessibility standards. To request them in an accessible format, contact Ryan Hilger at rhilger1@purdue.edu.