Veeco MultiMode AFM with Nanoscope 6 Controller

The Veeco multi-mode atomic force microscope is used for nanoscale imaging, as well as electrical and mechanical characterization of surfaces and materials. Please see below for a list of capabilities and operational modes. The multi-mode is our highest resolution AFM; however, samples must be small (under 15 mm in diameter), and only small areas can be scanned (10 x 10 μm) compared to the Dimension AFM.

Operational Modes

Contact Mode
Tapping Mode
ScanAsyst
Peakforce Tapping
Peakforce HR
Peakforce Quantitative Nanomechanics (QNM)
Phase Imaging
Force Modulation
Force Volume
Lateral Force Microscopy (LFM)
Electric Force Microscopy (EFM)
Magnetic Force Microscopy (MFM)
Kelvin Probe Force Microscopy (KPFM)
Piezoresponse Force Microscopy
Scanning Tunneling Microscopy (STM)
Imaging in fluid

Specifications

Sub-nanometer resolution
Max scan size: 10 x 10 μm
Max height: 2.5 μm

Contact

Aloke Bera
BRWN 3154
560 Oval Drive
West Lafayette, IN 47907
(765) 496-2216
Email: bera@purdue.edu