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Veeco MultiMode AFM with Nanoscope V Controller

An atomic force microscope uses a sharp tip to scan a small area on the surface of a sample. This provides an image of the surface features of the sample. With the MultiMode AFM the sample can be no larger than 15 mm in diameter. The maximum scan size is 10 microns x 10 microns and the maximum height is 2.5 microns.

Operational Modes

  • Contact Mode
  • Tapping Mode
  • Lateral Force Microscopy
  • Scanning Tunneling Microscopy

Contact

Ryan Hilger
BRWN 4135B
560 Oval Drive
West Lafayette, IN 47907
(765) 494-5234
Email: rhilger1@purdue.edu

Veeco Multimode AFM