Veeco MultiMode AFM with Nanoscope 6 Controller
The Veeco multi-mode atomic force microscope is used for nanoscale imaging, as well as electrical and mechanical characterization of surfaces and materials. Please see below for a list of capabilities and operational modes. The multi-mode is our highest resolution AFM; however, samples must be small (under 15 mm in diameter), and only small areas can be scanned (10 x 10 μm) compared to the Dimension AFM.
Operational Modes
- Contact Mode
- Tapping Mode
- ScanAsyst
- Peakforce Tapping
- Peakforce HR
- Peakforce Quantitative Nanomechanics (QNM)
- Phase Imaging
- Force Modulation
- Force Volume
- Lateral Force Microscopy (LFM)
- Electric Force Microscopy (EFM)
- Magnetic Force Microscopy (MFM)
- Kelvin Probe Force Microscopy (KPFM)
- Piezoresponse Force Microscopy
- Scanning Tunneling Microscopy (STM)
- Imaging in fluid
Specifications
- Sub-nanometer resolution
- Max scan size: 10 x 10 μm
- Max height: 2.5 μm
Contact
Aloke Bera
BRWN 3154
560 Oval Drive
West Lafayette, IN 47907
(765) 496-2216
Email: bera@purdue.edu
