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Veeco MultiMode AFM with Nanoscope 6 Controller

The Veeco multi-mode atomic force microscope is used for nanoscale imaging, as well as electrical and mechanical characterization of surfaces and materials. Please see below for a list of capabilities and operational modes. The multi-mode is our highest resolution AFM; however, samples must be small (under 15 mm in diameter), and only small areas can be scanned (10 x 10 μm) compared to the Dimension AFM.

Operational Modes

  • Contact Mode
  • Tapping Mode
  • ScanAsyst
  • Peakforce Tapping
  • Peakforce HR
  • Peakforce Quantitative Nanomechanics (QNM)
  • Phase Imaging
  • Force Modulation
  • Force Volume
  • Lateral Force Microscopy (LFM)
  • Electric Force Microscopy (EFM)
  • Magnetic Force Microscopy (MFM)
  • Kelvin Probe Force Microscopy (KPFM)
  • Piezoresponse Force Microscopy
  • Scanning Tunneling Microscopy (STM)
  • Imaging in fluid


  • Sub-nanometer resolution
  • Max scan size: 10 x 10 μm
  • Max height: 2.5 μm


Aloke Bera
BRWN 3154
560 Oval Drive
West Lafayette, IN 47907
(765) 496-2216

Veeco Multimode AFM