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Veeco MultiMode AFM with Nanoscope V Controller

Download the user guide here

Download STM guide here

An atomic force microscope uses a sharp tip to scan a small area on the surface of a sample. This provides an image of the surface features of the sample. With the MultiMode AFM the sample can be no larger than 15 mm in diameter. The maximum scan size is 10 microns x 10 microns and the maximum height is 2.5 microns.

Operational Modes

  • Contact Mode
  • Tapping Mode
  • Lateral Force Microscopy
  • Scanning Tunneling Microscopy


Aloke Bera
BRWN 3154
560 Oval Drive
West Lafayette, IN 47907
(765) 496-2216

Veeco Multimode AFM