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James Tarpo Jr. and Margaret Tarpo
Department of Chemistry

Bruker Dimension Icon AFM

Download the training guide here (PDF)

View training video - Part I

The Bruker Dimension Icon atomic force microscope is used for nanoscale imaging, as well as electrical and mechanical characterization of surfaces and materials. Please see below for a list of capabilities and operational modes. This AFM is especially well suited to analysis of large areas (90 x 90 μm), and the stage can accommodate large samples.

Operational Modes

  • Contact Mode
  • Tapping Mode
  • ScanAsyst
  • PeakForce Tapping
  • Peakforce Quantitative Nanomechanics (QNM)
  • Phase Imaging
  • Force Volume
  • Lateral Force Microscopy (LFM)
  • Electric Force Microscopy (EFM)
  • Magnetic Force Microscopy (MFM)
  • Kelvin Probe Force Microscopy (KPFM)
  • Piezoresponse microscopy
  • Conductive AFM

Specifications

  • Less than 1 nm height resolution
  • 90 x 90 μm scan size
  • 10 μm max height
  • Large samples

Contact

Aloke Bera
BRWN 3154
560 Oval Drive
West Lafayette, IN 47907
(765) 496-2216
Email: bera@purdue.edu

Dimension Icon AFM product image

PDFs on this page are part of the Department of Chemistry's Web Archive. They are no longer maintained and may not meet web accessibility standards. To request them in an accessible format, contact Ryan Hilger at rhilger1@purdue.edu.