Bruker Dimension Icon AFM
Download the training guide here
The Bruker Dimension Icon atomic force microscope is used for nanoscale imaging, as well as electrical and mechanical characterization of surfaces and materials. Please see below for a list of capabilities and operational modes. This AFM is especially well suited to analysis of large areas (90 x 90 μm), and the stage can accommodate large samples.
Operational Modes
- Contact Mode
- Tapping Mode
- ScanAsyst
- PeakForce Tapping
- Peakforce Quantitative Nanomechanics (QNM)
- Phase Imaging
- Force Volume
- Lateral Force Microscopy (LFM)
- Electric Force Microscopy (EFM)
- Magnetic Force Microscopy (MFM)
- Kelvin Probe Force Microscopy (KPFM)
- Piezoresponse microscopy
- Conductive AFM
Specifications
- Less than 1 nm height resolution
- 90 x 90 μm scan size
- 10 μm max height
- Large samples
Contact
Aloke Bera
BRWN 3154
560 Oval Drive
West Lafayette, IN 47907
(765) 496-2216
Email: bera@purdue.edu
