Bruker Dimension Icon AFM

The Bruker Dimension Icon atomic force microscope is used for nanoscale imaging, as well as electrical and mechanical characterization of surfaces and materials. Please see below for a list of capabilities and operational modes. This AFM is especially well suited to analysis of large areas (90 x 90 μm), and the stage can accommodate large samples.

Operational Modes

Contact Mode
Tapping Mode
ScanAsyst
PeakForce Tapping
Peakforce Quantitative Nanomechanics (QNM)
Phase Imaging
Force Volume
Lateral Force Microscopy (LFM)
Electric Force Microscopy (EFM)
Magnetic Force Microscopy (MFM)
Kelvin Probe Force Microscopy (KPFM)
Piezoresponse microscopy
Conductive AFM

Specifications

Less than 1 nm height resolution
90 x 90 μm scan size
10 μm max height
Large samples

Contact

Aloke Bera
BRWN 3154
560 Oval Drive
West Lafayette, IN 47907
(765) 496-2216
Email: bera@purdue.edu

Instrumentation Center
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